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SiC Diode Test Data
L o a d i n g
Organization
National Renewable Energy Laboratory (NREL) - view all
Update frequencyunknown
Last updatedover 2 years ago
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Overview

Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.

SiCdiodeegsgeothermalhigh temptest
Additional Information
KeyValue
Dcat Issued2014-08-01T06:00:00Z
Dcat Modified2017-08-08T22:12:40Z
Dcat Publisher NameSandia National Laboratories
Guidhttps://data.openei.org/submissions/3257
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