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SiC Diode High Temperature Test Data
L o a d i n g
Organization
National Renewable Energy Laboratory (NREL) - view all
Update frequencyunknown
Last updatedyesterday
Format
XLSX
Overview

Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.

SiCdiodeegsgeothermalhigh temptest
Additional Information
KeyValue
Dcat Issued2014-08-01T06:00:00Z
Dcat Modified2026-07-17T15:58:40Z
Dcat Publisher NameSandia National Laboratories
Guidhttps://data.openei.org/submissions/6752
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